Perovskite Solar Cell Degradation Under Reverse-Current Stress Depends on Hole-Transport Layer Choice
By
David S. Ginger
Recycled flavour. You've tasted this bagel before.
Summary
This study investigates degradation in perovskite solar cells under constant reverse-current stress, rather than the typical voltage-controlled tests. The key finding is that the choice of hole-transport layer (HTL) determines the dominant degradation pathway: cells with thick PTAA layers can withstand high reverse bias but undergo catastrophic breakdown under fixed reverse current near their one-sun maximum power point, while cells modified with MeO-2PACz interface layers behave differently.
Key quotes
· 3 pulledWe show that the choice of hole-transport layer dictates the dominant degradation pathway
Cells using thick poly(triphenylamine) (PTAA) layers can tolerate high reverse bias but quickly undergo catastrophic breakdown under fixed reverse current near their one-sun maximum power point
Previous studies of reverse-bias stability in perovskite solar cells have focused primarily on voltage-controlled tests
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